JPH0642222Y2 - 回路基板検査装置 - Google Patents

回路基板検査装置

Info

Publication number
JPH0642222Y2
JPH0642222Y2 JP18313887U JP18313887U JPH0642222Y2 JP H0642222 Y2 JPH0642222 Y2 JP H0642222Y2 JP 18313887 U JP18313887 U JP 18313887U JP 18313887 U JP18313887 U JP 18313887U JP H0642222 Y2 JPH0642222 Y2 JP H0642222Y2
Authority
JP
Japan
Prior art keywords
circuit board
movable plate
pin
inspected
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP18313887U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0187269U (en]
Inventor
和彦 関
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP18313887U priority Critical patent/JPH0642222Y2/ja
Publication of JPH0187269U publication Critical patent/JPH0187269U/ja
Application granted granted Critical
Publication of JPH0642222Y2 publication Critical patent/JPH0642222Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP18313887U 1987-11-30 1987-11-30 回路基板検査装置 Expired - Lifetime JPH0642222Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18313887U JPH0642222Y2 (ja) 1987-11-30 1987-11-30 回路基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18313887U JPH0642222Y2 (ja) 1987-11-30 1987-11-30 回路基板検査装置

Publications (2)

Publication Number Publication Date
JPH0187269U JPH0187269U (en]) 1989-06-08
JPH0642222Y2 true JPH0642222Y2 (ja) 1994-11-02

Family

ID=31474570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18313887U Expired - Lifetime JPH0642222Y2 (ja) 1987-11-30 1987-11-30 回路基板検査装置

Country Status (1)

Country Link
JP (1) JPH0642222Y2 (en])

Also Published As

Publication number Publication date
JPH0187269U (en]) 1989-06-08

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